Call for papers: Characterisation, Measurement and Analysis of Nanoparticles

http://www.inderscience.com/browse/callpaper.php?callID=583

Call for papers: Characterisation, Measurement and Analysis of Nanoparticles

A special issue of the International Journal of Nanoparticles (IJNP)

Important Dates:
Deadline for submission of manuscripts : 28 March 2007
Communication of peer reviews to authors : 30 April 2007
Deadline for revised manuscripts : 30 June 2007

Nanoparticles have had a large impact on drug delivery systems, structural materials, data storage systems, biochemical and biomedical diagnostics, adhesives, pigments, optical communication and catalytic developments in recent years. With the advent of the many new techniques to fabricate nanostructures and the associated potential applications, a review of current and potential future techniques by which nanoparticles are characterised is required.
For the purpose of this issue, nanoparticles are defined as particles which have at least one dimension less that 100 nm. On this scale, characterisation is essential and particularly challenging. This special inaugural issue is aimed at the recent developments in the field of nanostructure characterisation techniques.

Nanoparticle characterisation techniques that are relevant to this issue include but are not limited to electron microscopy, atomic force microscopy (AFM), dynamic light scattering (DLS), single photon emission tomography (SPECT), magnetic resonance (MR) imaging and spectroscopy, surface-enhanced Raman scattering (SERS), X-ray diffractometry, and Fourier transform infrared spectroscopy (FTIR).

The subject coverage of this special issue includes, but is not limited to, topics that address:

* Research that spans several fields is particularly welcome
* Particle size measurement
* Nanoparticle surface area
* Density of nanoparticles
* Nanoparticle tracking analysis
* Analysis with optical tweezers
* Zeta potential measurement
* High resolution electron microscopy (HREM) image processing
* Particle mass measurement

For more information, please see the Journal Call for Papers website.