- Some issues in surface and form metrology
- Lifting wavelet algorithm for freeform surface filtering using a Gaussian prediction operator
- Advanced characterisation methodology for engineered surfaces
- Controllable fabrication of freeform optics
- Correlation of micro and nano-scale defects with WVTR for aluminium oxide barrier coatings for flexible photovoltaic modules
- Selection of metrology and manufacturing process for a functional surface
8 October 2013
Special issue published: "Surfaces and Their Measurement – Part 1"
International Journal of Precision Technology 3(3) 2013
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